Three dimensional microstructural characterization of nanoscale precipitates in AA7075-T651 by focused ion beam (FIB) tomography
نویسندگان
چکیده
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ژورنال
عنوان ژورنال: Materials Characterization
سال: 2016
ISSN: 1044-5803
DOI: 10.1016/j.matchar.2016.05.009